发明名称 Die-to-Die Gap Control for Semiconductor Structure and Method
摘要 An embodiment is a structure comprising a substrate, a first die, and a second die. The substrate has a first surface and a second surface opposite the first surface. The substrate has a through substrate via extending from the first surface towards the second surface. The first die is attached to the substrate, and the first die is coupled to the first surface of the substrate. The second die is attached to the substrate, and the second die is coupled to the first surface of the substrate. A first distance is between a first edge of the first die and a first edge of the second die, and the first distance is in a direction parallel to the first surface of the substrate. The first distance is equal to or less than 200 micrometers.
申请公布号 US2013049216(A1) 申请公布日期 2013.02.28
申请号 US201113221447 申请日期 2011.08.30
申请人 LIN JING-CHENG;LU SZU WEI;SHIH YING-CHING;WANG YING-DA;KUO LI-CHUNG;LEE LONG HUA;JENG SHIN-PUU;YU CHEN-HUA;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN JING-CHENG;LU SZU WEI;SHIH YING-CHING;WANG YING-DA;KUO LI-CHUNG;LEE LONG HUA;JENG SHIN-PUU;YU CHEN-HUA
分类号 H01L23/498;H01L21/50 主分类号 H01L23/498
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