发明名称 |
MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To dramatically improve measuring speed. <P>SOLUTION: A retrieval unit 53 retrieves an extreme value which is a maximum value or a minimum value from among first measured values measured at measuring points set at a first interval in a frequency direction. A measurement control unit 52 controls a measurement unit 31, and causes the measurement unit 31 to perform measurement in a frequency range including the extreme value retrieved from the first measured values, at a predetermined number of measuring points set at a predetermined second interval which is narrower than the first interval. The retrieval unit 53 retrieves an extreme value which is a maximum value or a minimum value from among second measured values measured at measuring points set at the second interval. A quadrant frequency measuring point adding unit 55 sets a predetermined number of measuring points set at a predetermined third interval which is narrower than the first interval, for a frequency range including a quadrant frequency of a frequency of the extreme value retrieved from the second measured values. The present invention can be applied to an impedance analyzer. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013040902(A) |
申请公布日期 |
2013.02.28 |
申请号 |
JP20110179742 |
申请日期 |
2011.08.19 |
申请人 |
HIOKI EE CORP |
发明人 |
TANAKA HIDEAKI;HARUHARA MASASHI |
分类号 |
G01R27/28;G01R23/16;G01R29/22 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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