| 摘要 |
<p>Provided is a circuit operation analysis method that can generate a test pattern with a higher operation ratio and derive a larger peak power consumption, while preventing processing time from becoming very large, and preventing required memory volume from increasing. This circuit operation analysis method comprises: a maximum change extraction process that receives input of circuit wiring information to be analyzed and input of a circuit test pattern to be applied to said circuit wiring information, varies a measurement interval in the circuit test pattern, and from the circuit test pattern, extracts an interval for which the operation speed of a flip-flop contained in the circuit wiring information is a maximum; a pattern generation process that generates a second circuit test pattern on the basis of a pattern contained in the aforementioned interval; and a power consumption analysis process that analyzes the power consumption for the circuit wiring information when the second circuit test pattern is applied.</p> |
