发明名称 |
SYSTEM AND METHOD FOR DETECTING STRUCTURAL DEFECTS WITHIN A STENT |
摘要 |
<p>The invention relates to a system (1) for detecting defects (12) within a structure of struts (2) forming a stent (3), the system comprising a power supply (8) for applying an electrical potential to a proximal end (9) and to a distal end (10) of said stent (3) in order to establish an electrical current flow between said proximal end (9) and said distal end (10), and a temperature sensor (7) such as a infrared camera, adjacent to said stent (3) for detecting a defect (12) within said structure of struts (2), said temperature sensor (7) being adapted to measure a temperature profile of said stent (3). Further, the invention relates to a respective method for detecting those defects (12).</p> |
申请公布号 |
WO2013026542(A1) |
申请公布日期 |
2013.02.28 |
申请号 |
WO2012EP03465 |
申请日期 |
2012.08.14 |
申请人 |
ABBOTT LABORATORIES VASCULAR ENTERPRISES LIMITED;DIEDRICHS, CHRISTOPH;STOCKERT, GUNTHER |
发明人 |
DIEDRICHS, CHRISTOPH;STOCKERT, GUNTHER |
分类号 |
G01N25/72;G01N21/88 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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