发明名称 TANTALUM SPUTTERING TARGET
摘要 <p>TANTALUM SPUTTERING TARGETProvided is a tantalum sputtering target, in which 1 mass ppm ormore and 50 mass ppm or less of boron is contained as an essential component, and of which the purity excluding boron and gas components is 99.998% or higher. Thereby obtained is a high-purity tantalum sputtering target having a uniform and fine structure and enabling plasma stabilization and achievement of superior film evenness (uniformity).</p>
申请公布号 SG186765(A1) 申请公布日期 2013.02.28
申请号 SG20120093530 申请日期 2011.07.21
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 SENDA SHINICHIRO;FUKUSHIMA ATSUSHI
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