发明名称 DIE HAVING WIRE BOND ALIGNMENT SENSING STRUCTURES
摘要 A semiconductor die includes a substrate having a topside including active circuitry having an array of bond pads thereon separated by gaps including a minimum gap. At least a portion of the array of bond pads are connected to nodes in the active circuitry. At least one wire bond alignment sensing structure includes a first bond pad selected from the array of bond pads, and a guard element positioned along at least a portion of the first bond pad. The guard element is spaced apart by a distance shorter than the minimum gap from the first bond pad.
申请公布号 US2013049789(A1) 申请公布日期 2013.02.28
申请号 US201113222744 申请日期 2011.08.31
申请人 KIM CHANGDUK;TEXAS INSTRUMENTS INCORPORATED 发明人 KIM CHANGDUK
分类号 G01R31/26;H01L23/485 主分类号 G01R31/26
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