IMAGING DEVICE, SOLID-STATE IMAGING ELEMENT, LENS FOR IMAGING DEVICE, AND NEAR INFRARED LIGHT CUT-OFF FILTER

摘要

PROBLEM TO BE SOLVED: To provide a near infrared light cut-off filter for a solid state imaging element or for a light receiving element which is capable of satisfying near infrared light cut-off ability and also offering more material options, thereby achieving design flexibility such as downsizing according to needs, and to provide an imaging device, a solid-state imaging element and a lens for the imaging device having the cut-off filters mounted thereon.

SOLUTION: An imaging device 101 is configured by arranging a near infrared light cut-off filter 1 for shielding near infrared light, between an imaging subject and a photoelectric conversion element 62. The near infrared light cut-off filter 1 includes: an optical member 10; an anti-reflection layer 30 formed on a surface layer of a second principal surface 12 of the optical member 10; a near infrared shielding layer 20 formed on the second principal surface 12 or/and a first principal surface 11 of the optical member 10. The near infrared shielding layer 20 is formed by laminating at least a pair of a selected wavelength reflecting layer 21R in which a liquid crystal phase with a screw axis having a rightward rotational direction is immobilized, and a selected wavelength reflecting layer 21L in which a liquid crystal phase with a screw axis having a leftward rotational direction is immobilized.

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