发明名称 METHOD OF ABNORMALITY DETECTION/DIAGNOSIS AND SYSTEM OF ABNORMALITY DETECTION/DIAGNOSIS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and a system of abnormality detection/diagnosis capable of detecting abnormality with high sensitivity and at an early stage in facilities such as a plant. <P>SOLUTION: Abnormality detection is performed using operation information such as operating time of a facility and output signals of multiple sensors attached to the facility. With a maintenance history such as a work report including past measure examples such as a work history and replacement part information, measures for the detected abnormality are associated, the abnormality detection and the past maintenance history are linked together, and a facility record is consulted, to classify and present the abnormality which needs action. Thus, the accuracy of diagnosis can be improved. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013041448(A) 申请公布日期 2013.02.28
申请号 JP20110178316 申请日期 2011.08.17
申请人 HITACHI LTD 发明人 MAEDA SHUNJI;SHIBUYA HISAE
分类号 G05B23/02 主分类号 G05B23/02
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