发明名称 MANUFACTURING METHOD FOR BOTTOM PLUNGER OF PROBE PIN
摘要 PURPOSE: A manufacturing method of a lower contact terminal of a probe pin is provided to reduce the mass of metal material forming the lower contact terminal of a probe pin. CONSTITUTION: A metal sheet is cut and punched so that multiple arms form a radial shape. The mutually connected part of multiple arms is bent so that multiple arms are in parallel. The surfaces of multiple arms are cut in a C shape. A part which is cut in a C shape is bent to be mutually protruded in a radial shape.
申请公布号 KR101237819(B1) 申请公布日期 2013.02.28
申请号 KR20120049473 申请日期 2012.05.10
申请人 QUALMAX TESTECH, INC. 发明人 CHOI, JONG KOOK
分类号 G01R1/067;G01R19/165;G01R31/28 主分类号 G01R1/067
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