发明名称 VOLTAGE MONITORING TEST CIRCUIT AND VOLTAGE MONITORING METHOD USING THE SAME
摘要 A voltage monitoring test circuit includes a switching control signal generation unit configured to receive first and second switching signals, control the first and second switching signals such that an enable period of the first switching signal and an enable period of the second switching signal do not overlap with each other, and generate first and second switching control signals where a first voltage is transmitted in response to the first switching control signal and a second voltage is transmitted in response to the second switching control signal.
申请公布号 US2013049736(A1) 申请公布日期 2013.02.28
申请号 US201113339173 申请日期 2011.12.28
申请人 CHOI YOUNG GEUN;HYNIX SEMICONDUCTOR INC. 发明人 CHOI YOUNG GEUN
分类号 G01R19/00 主分类号 G01R19/00
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