METHOD FOR GENERATING MASTER DATA FOR SUBSTRATE INSPECTION

摘要

The present invention addresses the problem of providing a method for generating master data for substrate inspection that allows highly applicable master data to be generated easily. The method for generating master data for inspecting substrates is used to inspect a substrate (B) on which components (Pa1-Pa8) are mounted. This method comprises: a data generation step in which common master data (L1-L4) to be used for the multiple components (Pa1-Pa8) are generated; and a verification step in which the substrate (B) is inspected in order to verify the validity of the generated master data (L1-L4).