发明名称 |
CHEMICAL-MECHANICAL POLISHING LIQUID |
摘要 |
<p>Disclosed in the present invention is a chemical-mechanical polishing liquid. The polishing liquid contains a carrier, abrasive particles, water soluble oxysalts and water soluble polyhydroxy compounds. The chemical-mechanical polishing liquid in the present invention has a relatively high SiO2 polishing rate and a high selection ratio of SiO2/Si3N4 removing rates, at the same time, and has a relatively high Ta polishing rate, and the selection ratio of Ta/Cu removing rates being close to 1.</p> |
申请公布号 |
WO2013026254(A1) |
申请公布日期 |
2013.02.28 |
申请号 |
WO2012CN00765 |
申请日期 |
2012.06.04 |
申请人 |
ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;PANG, KELIANG;WANG, YUCHUN |
发明人 |
PANG, KELIANG;WANG, YUCHUN |
分类号 |
C09G1/02 |
主分类号 |
C09G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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