发明名称 CHEMICAL-MECHANICAL POLISHING LIQUID
摘要 <p>Disclosed in the present invention is a chemical-mechanical polishing liquid. The polishing liquid contains a carrier, abrasive particles, water soluble oxysalts and water soluble polyhydroxy compounds. The chemical-mechanical polishing liquid in the present invention has a relatively high SiO2 polishing rate and a high selection ratio of SiO2/Si3N4 removing rates, at the same time, and has a relatively high Ta polishing rate, and the selection ratio of Ta/Cu removing rates being close to 1.</p>
申请公布号 WO2013026254(A1) 申请公布日期 2013.02.28
申请号 WO2012CN00765 申请日期 2012.06.04
申请人 ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;PANG, KELIANG;WANG, YUCHUN 发明人 PANG, KELIANG;WANG, YUCHUN
分类号 C09G1/02 主分类号 C09G1/02
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