| 摘要 |
<p>In order to more accurately measure a deterioration state of a semiconductor integrated circuit by means of a simpler configuration, a deterioration diagnostic circuit of the present invention is provided with: a block to be tested, which includes a first circuit to be subjected to deterioration diagnosis; a reference block, which includes a second circuit that is provided with a configuration identical to that of the first circuit; a determining means, which determines whether elements constituting the block to be tested are deteriorated or not by comparing characteristics of first signals, which are outputted from the block to be tested in the cases where signals indicating measurement mode are inputted, with characteristics of second signals outputted from the reference block; and a control means, which outputs, to the determining means, the signals that indicate the measurement mode.</p> |
