LIFETIME PREDICTION TESTING DEVICE OF OLED

摘要

PURPOSE: A test device for predicting the lifetime of an OLED is provided to facilitate a stress acceleration test by arranging heating plate assemblies in a row. CONSTITUTION: The lifetime of an OLED is tested by using a Peltier element(100). The Peltier element is mounted on a heating plate assembly. A heat transfer plate(200) mounts the Peltier element. A heat sink(300) is installed on the heat transfer plate. A cooling fan is adhered to the heat sink.