PROBE CARD

摘要

PURPOSE: A probe card is provided to implement an accurate test by easily passing a protrusion formed on the upper side of conductive materials through an oxide layer of pads. CONSTITUTION: A plurality of probe tips(110) have at least one protrusion on the upper side thereof. The probe tips are electrically connected to pads of at least one test chip. A space conversion unit(120,130) forms a plurality of first pads and electrically connects the bottom of the probe tips to the first pads. An interposer(140) electrically connects the first pads to a circuit board.