发明名称 Low Frequency Impedance Measurement with Source Measure Units
摘要 A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage of current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.
申请公布号 EP2562553(A1) 申请公布日期 2013.02.27
申请号 EP20120181263 申请日期 2012.08.21
申请人 KEITHLEY INSTRUMENTS, INC. 发明人 SOBOLEWSKI, GREGORY
分类号 G01R27/02 主分类号 G01R27/02
代理机构 代理人
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