发明名称 Lithographic apparatus, stage apparatus and device manufacturing method
摘要 A lithographic apparatus is described, the apparatus comprising an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate, a chuck constructed to hold the substrate table; a positioning device for, in use, displacing the chuck; a control unit configured to control the positioning device, wherein the control unit is arranged to drive the positioning device to excite the chuck by a substantially dynamic force to enable deformation of the chuck, prior to aligning the patterning device.
申请公布号 US8384881(B2) 申请公布日期 2013.02.26
申请号 US20080238964 申请日期 2008.09.26
申请人 ASML NETHERLANDS B.V.;OTTENS JOOST JEROEN;BIJVOET DIRK-JAN;VAN DER ZOUW GERBRAND;DE JONG FREDERIK EDUARD 发明人 OTTENS JOOST JEROEN;BIJVOET DIRK-JAN;VAN DER ZOUW GERBRAND;DE JONG FREDERIK EDUARD
分类号 G03B27/58;G03B27/32 主分类号 G03B27/58
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