| 摘要 |
The present invention provides a control method and apparatus for printing a multilayer pattern on a substrate. In one embodiment, a method for printing a multilayer pattern includes a first printing operation comprising depositing a first patterned layer on a region of a surface of the substrate, a second printing operation comprising depositing a second patterned layer over the region of the surface or first patterned layer, and verifying the precision of the alignment of the second patterned layer relative to the first patterned layer. Verifying comprises acquiring a first optical image of the first patterned layer after the first printing operation, acquiring a second optical image of the second patterned layer after the second printing operation, and determining the position of the second patterned layer by performing an image subtraction process to form a first subtracted optical image and comparing the subtracted optical image with the first image. |
