发明名称 |
METHOD OF FORMING JUNCTION REGION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a junction region of a semiconductor device is provided to simplify a forming process by reducing the number of mask processes using a tilt ion implantation process. CONSTITUTION: First to fifth junction regions are defined on a semiconductor substrate. The first junction region is interposed between the first junction regions. A first impurity region(131a) is formed by injecting a first impurity into the first to fourth junction regions. A second impurity region(133a) is formed by injecting a second impurity with a first tilt ion implantation process. A third impurity region(135a) is formed by injecting a third impurity with a second tilt ion implantation process.
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申请公布号 |
KR20130019241(A) |
申请公布日期 |
2013.02.26 |
申请号 |
KR20110081286 |
申请日期 |
2011.08.16 |
申请人 |
SK HYNIX INC. |
发明人 |
KIM, TAE GYUN;WOO, WON SIC |
分类号 |
H01L21/336;H01L21/265;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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