发明名称 METHOD OF FORMING JUNCTION REGION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a junction region of a semiconductor device is provided to simplify a forming process by reducing the number of mask processes using a tilt ion implantation process. CONSTITUTION: First to fifth junction regions are defined on a semiconductor substrate. The first junction region is interposed between the first junction regions. A first impurity region(131a) is formed by injecting a first impurity into the first to fourth junction regions. A second impurity region(133a) is formed by injecting a second impurity with a first tilt ion implantation process. A third impurity region(135a) is formed by injecting a third impurity with a second tilt ion implantation process.
申请公布号 KR20130019241(A) 申请公布日期 2013.02.26
申请号 KR20110081286 申请日期 2011.08.16
申请人 SK HYNIX INC. 发明人 KIM, TAE GYUN;WOO, WON SIC
分类号 H01L21/336;H01L21/265;H01L29/78 主分类号 H01L21/336
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