| 摘要 |
PURPOSE: A light emitting diode testing device is provided to improve the inspection reliability of the light emitting diode by reducing a loss of lights generated by the light emitting diode. CONSTITUTION: A light emitting diode testing device comprises an integrating sphere(102), a chuck(130), and a probe card(110). The integrating sphere with an opened underside measures properties of the lights generated by the light emitting diode. The chuck includes a support plate and a support block. The probe card is joined to the opened underside of the integrating sphere, has an opening where the support block is inserted, and applies electrical signals to the light emitting diode on the support block. |
