发明名称 |
SINGLE ELECTRON TRANSISTOR AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: A single electron transistor and a manufacturing method thereof are provided to reduce the size of a quantum dot by surrounding the quantum dot with a tunneling insulation layer and a gate insulation layer in a trench. CONSTITUTION: A semiconductor substrate includes a protrusion on one side thereof. A source region(14) is formed on the protrusion of the substrate. A sidewall insulation layer(22) is formed on the etched substrate and a part of the sidewall of the protrusion. A drain region(34) faces the source region and is more protrusive than the sidewall insulation layer. The gate insulation layer surrounds the front, the rear, and the top of the quantum dot.
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申请公布号 |
KR20130019201(A) |
申请公布日期 |
2013.02.26 |
申请号 |
KR20110081210 |
申请日期 |
2011.08.16 |
申请人 |
SNU R&DB FOUNDATION |
发明人 |
PARK, BYUNG GOOK;KIM, KYUNG WAN;LEE, JUNG HAN |
分类号 |
H01L29/775;H01L21/335 |
主分类号 |
H01L29/775 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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