发明名称 Method and apparatus for thermal treatment of semiconductor workpieces
摘要 The present invention provides an apparatus and method for rapid and uniform thermal treatment of semiconductor workpieces in two closely arranged thermal treatment chambers with a retractable door between them. The retractable door moves in between two thermal treatment chambers during heating or cooling process, and additional heating and cooling sources are provided for double-side thermal treatment of the semiconductor workpiece.
申请公布号 US8383429(B2) 申请公布日期 2013.02.26
申请号 US20100733436 申请日期 2010.06.01
申请人 ACM RESEARCH (SHANGHAI) INC.;MA YUE;HE CHUAN;PANG ZHENXU;WANG DAVID;NUCH VOHA 发明人 MA YUE;HE CHUAN;PANG ZHENXU;WANG DAVID;NUCH VOHA
分类号 H01L21/00 主分类号 H01L21/00
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