发明名称 Substrate processing apparatus, method for measuring distance between electrodes, and storage medium storing program
摘要 A distance between electrodes can be accurately measured by using a lifter. A substrate processing apparatus includes an upper electrode 120 and a lower electrode 310 facing each other within a processing chamber 102; a lift pin 332 that is protrusible from and retractable below the lower electrode and lifts up a substrate mounted on the lower electrode to be separated from the lower electrode; a lifter 330 that elevates the lift pin up and down; and a controller 400 that elevates the lift pin upward and brings the lift pin into contact with the upper electrode by driving the lifter while the substrate is not mounted on the lower electrode and measures a distance between the electrodes based on a moving distance of the lifter.
申请公布号 US8383000(B2) 申请公布日期 2013.02.26
申请号 US20100958877 申请日期 2010.12.02
申请人 TOKYO ELECTRON LIMITED;TSUJIMOTO HIROSHI;KOBAYASHI MAKOTO;TAMURA JUN;WADA NOBUHIRO 发明人 TSUJIMOTO HIROSHI;KOBAYASHI MAKOTO;TAMURA JUN;WADA NOBUHIRO
分类号 G01L21/30;G01R31/00 主分类号 G01L21/30
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