发明名称 Structure and method for biasing phase change memory array for reliable writing
摘要 A memory array having memory cells comprising a diode and a phase change material is reliably programmed by maintaining all unselected memory cells in a reverse biased state. Thus leakage is low and assurance is high that no unselected memory cells are disturbed. In order to avoid disturbing unselected memory cells during sequential writing, previously selected word and bit lines are brought to their unselected voltages before new bit lines and word lines are selected. A modified current mirror structure controls state switching of the phase change material.
申请公布号 US8385141(B2) 申请公布日期 2013.02.26
申请号 US201113221711 申请日期 2011.08.30
申请人 SANDISK 3D LLC;SCHEUERLEIN ROY E. 发明人 SCHEUERLEIN ROY E.
分类号 G11C7/00;G11C11/00 主分类号 G11C7/00
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