发明名称 Multi-pass programming in a memory device
摘要 A method for programming a memory device, a memory device, and a memory system are provided. According to at least one such method, a first programming pass generates a plurality of first programming pulses to increase the threshold voltages of target memory cells to either a pre-program level or to the highest programmed threshold. A second programming pass applies a plurality of second programming pulses to the target memory cells to increase their threshold voltages only if they were programmed to the pre-program level. The target memory cells programmed to their respective target threshold levels during the first pass are not programmed further.
申请公布号 US8385118(B2) 申请公布日期 2013.02.26
申请号 US201113286390 申请日期 2011.11.01
申请人 MICRON TECHNOLOGY, INC.;YIP AARON 发明人 YIP AARON
分类号 G11C11/34 主分类号 G11C11/34
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