发明名称 CLEANING METHOD AND CLEANING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a cleaning method and a cleaning device which can clean a large number of wafers per unit time. <P>SOLUTION: A batch cleaning method for cleaning a plurality of semiconductor substrates once includes: a first step of transporting the semiconductor substrates in a state where the semiconductor substrates are held at predetermined intervals; a second step of sandwiching the semiconductor substrates between a plurality of roll brushes which are provided on each of front surfaces and rear surfaces of the semiconductor substrates and of which longitudinal directions are arranged in parallel with the front surfaces and the rear surfaces thereof; and a third step of cleaning the semiconductor substrates by rotating the roll brushes provided on each of the front surfaces and the rear surfaces. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013038356(A) 申请公布日期 2013.02.21
申请号 JP20110175602 申请日期 2011.08.11
申请人 TOSHIBA CORP 发明人
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
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