发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a transistor using an oxide semiconductor which has high electron field-effect mobility, less variation in threshold voltage, and high reliability. <P>SOLUTION: A semiconductor device comprises a transistor including an insulator substrate discharging oxygen by heat treatment, an oxide semiconductor film provided on the insulator substrate, and a channel formed in the oxide semiconductor film. The insulator substrate discharging oxygen by heat treatment can be manufactured by performing oxygen ion implantation at least on a side of the insulator substrate on which the oxide semiconductor film is provided. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013038396(A) |
申请公布日期 |
2013.02.21 |
申请号 |
JP20120149650 |
申请日期 |
2012.07.03 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ENDO YUTA;HIZUKA JUNICHI;SATO YUICHI |
分类号 |
H01L21/336;G02F1/1368;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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