发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a transistor using an oxide semiconductor which has high electron field-effect mobility, less variation in threshold voltage, and high reliability. <P>SOLUTION: A semiconductor device comprises a transistor including an insulator substrate discharging oxygen by heat treatment, an oxide semiconductor film provided on the insulator substrate, and a channel formed in the oxide semiconductor film. The insulator substrate discharging oxygen by heat treatment can be manufactured by performing oxygen ion implantation at least on a side of the insulator substrate on which the oxide semiconductor film is provided. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013038396(A) 申请公布日期 2013.02.21
申请号 JP20120149650 申请日期 2012.07.03
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ENDO YUTA;HIZUKA JUNICHI;SATO YUICHI
分类号 H01L21/336;G02F1/1368;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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