| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection method of a light-emitting element and the like, used for easily and rapidly identifying a light-emitting element by using photoluminescence. <P>SOLUTION: The inspection process comprises: a light irradiation process (a step 201) in which, for excitation light, light (second wavelength light) whose wavelength is shorter than a wavelength (a first wavelength) emitted by energization is radiated without energizing a light-emitting element 1; a detection process (a step 202), in which light emitted from the light-emitting element 1 by being irradiated with light having the second wavelength is detected; and an identification process (a step 203) in which a state of a current leakage of the light-emitting element 1 is determined on the basis of light intensity of the first wavelength emitted by the light-emitting element 1. <P>COPYRIGHT: (C)2013,JPO&INPIT |
