| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing the increase of a chip size and the increase of parallel testing time without reducing evaluation accuracy. <P>SOLUTION: The semiconductor device includes a plurality of memory arrays, a read/write amplifier (RWAMP) commonly disposed for the plurality of memory arrays to generate read data for amplifying read data from a memory cell to output it to the outside during a reading operation, and generate write data to the memory cell based on write data supplied from the outside during a writing operation, a switch disposed for each of the plurality of memory arrays, a first control circuit (12b) for generating a first control signal (LMIOSW) to sequentially make conductive switches of those activated among the plurality of memory arrays, and a second control circuit (14) for generating a second control signal (DAE) for activating the read/write amplifier based on the number of memory arrays to be activated. <P>COPYRIGHT: (C)2013,JPO&INPIT |
