| 摘要 |
<P>PROBLEM TO BE SOLVED: To appropriately set the pattern shape of a projected pattern in 3D position measurement. <P>SOLUTION: The present invention is characterized by having: projection means that projects pattern light to a measurement subject; imaging means that images the measurement subject to which the pattern light has been projected, acquiring a captured image of the measurement subject; measurement means that, on the basis of the captured image, the position and attitude of the projection means, and the position and attitude of the imaging means, measures the position and/or attitude of the measurement subject; setting means that, from the range of fluctuation of the position and/or attitude of the measurement subject, sets the pattern light identification resolving power; and alteration means that, in accordance with the identification resolving power, alters the pattern shape of the pattern light. <P>COPYRIGHT: (C)2013,JPO&INPIT |
