| 摘要 |
<P>PROBLEM TO BE SOLVED: To calculate a parameter of an equivalent circuit of a resistor at sufficiently high accuracy. <P>SOLUTION: An apparatus for measuring a parameter of an equivalent circuit of a resistor executes: Zθ frequency characteristic acquisition processing for acquiring respective frequency characteristics of Z and θ in a frequency band including a parallel resonance frequency fp of the resistor; r frequency characteristic measurement processing for detecting a frequency characteristic of resistance r of the resistor, the parallel resonance frequency fp and a maximum value r<SB POS="POST">max</SB>; Q calculation processing for calculating Q from quadrant frequencies f1, f2; C calculation processing for calculating a parameter value Cv (=Q/(2×π×fp×r<SB POS="POST">max</SB>)); L calculation processing for calculating a parameter value Lv (=2×Q<SP POS="POST">2</SP>/ä(2×π×fp)<SP POS="POST">2</SP>×Cv×(2×Q<SP POS="POST">2</SP>-1)}); GB calculation processing for calculating conductance G<SB POS="POST">L</SB>and susceptance B<SB POS="POST">L</SB>in a frequency f<SB POS="POST">L1</SB>on the basis of Z and θ in a low band side frequency f<SB POS="POST">L1</SB>sufficiently separated from the parallel resonance frequency fp; and R calculation processing for calculating a parameter value Rv(=2×π×f<SB POS="POST">L</SB>×G<SB POS="POST">L</SB>×Lv/(2×π×f<SB POS="POST">L</SB>×Cv-B<SB POS="POST">L</SB>)). <P>COPYRIGHT: (C)2013,JPO&INPIT |
