发明名称 EQUIVALENT CIRCUIT ANALYZING APPARATUS AND EQUIVALENT CIRCUIT ANALYZING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an equivalent circuit analyzing apparatus that, when there is an error in any element constant of an equivalent circuit estimated from the frequency characteristic of a device under test (DUR), does not require the measuring person to judge which element constant is to be changed and how in order to eliminate this error, and enables the person to obtain accurate element constant by simple operation. <P>SOLUTION: An equivalent circuit analyzing apparatus 1 comprises a touch panel 10; a measuring unit 2 that measures the frequency characteristic of the complex impedance of a DUT 90 and causes the touch panel 10 to display the characteristic in a graph; an estimating unit 3 that estimates each element constant of the equivalent circuit on the basis of the frequency characteristic of the DUT 90; a theoretical characteristic calculating unit 5 that calculates the frequency characteristic of the equivalent circuit and causes its graph and each element constant to be displayed; and an element constant change processing unit 6 that, after touching the pertinent region of the graph of the equivalent circuit displayed on the touch panel 10, matches that touch position to a shifting operation accomplished on the touch panel and thereby changes the element constant of the equivalent circuit. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013036849(A) 申请公布日期 2013.02.21
申请号 JP20110172950 申请日期 2011.08.08
申请人 HIOKI EE CORP 发明人 HARUHARA MASASHI;TANAKA HIDEAKI
分类号 G01R27/02 主分类号 G01R27/02
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