发明名称 CAPACITOR AND PREPARATION METHOD THEREOF
摘要 Disclosed are a capacitor and a preparation method thereof. The capacitor employs a low pressure tetraethyl orthosilicate-low pressure silicon nitride-low pressure tetraethyl orthosilicate structure to replace the oxide-nitride-oxide structure of the existing capacitor and has a relatively high unit capacitance value. In addition, when preparing the low pressure tetraethyl orthosilicate-low pressure silicon nitride-low pressure tetraethyl orthosilicate structure, since it is prepared using a low pressure chemical vapor deposition method with a relatively low temperature, the heat produced by the whole process thereof is relatively low, which is insufficient to make the semiconductor device offset or make the gate metal layer or metallized silicon layer peel off. Therefore, the capacitor and preparation method thereof in the present invention can be well applied in the 0.5µm PIP capacitor process or below.
申请公布号 WO2013023528(A1) 申请公布日期 2013.02.21
申请号 WO2012CN79553 申请日期 2012.08.02
申请人 CSMC TECHNOLOGIES FAB1 CO., LTD.;QIN, RENGANG;WANG, DEJIN;HE, BOYONG 发明人 QIN, RENGANG;WANG, DEJIN;HE, BOYONG
分类号 H01L21/8242 主分类号 H01L21/8242
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