发明名称 |
Integrated Circuit With an Adaptable Contact Pad Reconfiguring Architecture |
摘要 |
An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.
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申请公布号 |
US2013043939(A1) |
申请公布日期 |
2013.02.21 |
申请号 |
US201113340873 |
申请日期 |
2011.12.30 |
申请人 |
BROADCOM CORPORATION;KOTHARI LOVE;BENNETT JAMES;ZHANG ZHONGMIN |
发明人 |
KOTHARI LOVE;BENNETT JAMES;ZHANG ZHONGMIN |
分类号 |
H01L25/00 |
主分类号 |
H01L25/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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