发明名称 |
MANUFACTURING METHOD OF PIEZOELECTRIC FILM ELEMENT, PIEZOELECTRIC FILM ELEMENT, AND PIEZOELECTRIC DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a non-lead piezoelectric film element in which there are few etching residues and reliability in post steps is high when microfabrication is performed by dry etching, a piezoelectric film element, and a piezoelectric device. <P>SOLUTION: A manufacturing method of a piezoelectric film element 1 includes the steps of: forming a piezoelectric film 5 composed of a non-lead alkaline niobium oxide compound having a perovskite structure represented by the composition formula (K<SB POS="POST">1-x</SB>Na<SB POS="POST">x</SB>)NbO<SB POS="POST">3</SB>on a substrate 2; and an etching the piezoelectric film 5 using a low-pressure plasma in an atmosphere including a fluorine-based reactive gas. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013038322(A) |
申请公布日期 |
2013.02.21 |
申请号 |
JP20110174981 |
申请日期 |
2011.08.10 |
申请人 |
HITACHI CABLE LTD |
发明人 |
HORIKIRI FUMIMASA;SHIBATA KENJI;SUENAGA KAZUFUMI;WATANABE KAZUTOSHI;NOMOTO AKIRA |
分类号 |
H01L41/22;C23C14/08;H01L21/3065;H01L21/822;H01L27/04;H01L41/08;H01L41/09;H01L41/18;H01L41/39 |
主分类号 |
H01L41/22 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|