摘要 |
<p>A gas analyzer (100) is provided with: an irradiation unit (2) arranged on the outside of a flue wall (1a); a first reflector (3) for reflecting measurement light that has passed through a sample gas (Sg) emitted from the irradiation unit (2); a light-receiving unit (4) arranged on the outside of the flue wall (1a) and adapted for receiving the measurement light reflected by the first reflector (3); a second reflector (5) arranged on the outside of the flue wall (1a) and adapted for reflecting the measurement light toward the light-receiving unit (4); a known-substance-accommodating unit (6) for accommodating a known substance, the unit being provided in a space on an optical path between the irradiation unit (2) and the second reflector (5); a calculation unit (7) for reflecting the measurement light emitted from the irradiation unit (2) using the first reflector (3) and analyzing the sample gas (Sg), reflecting the measurement light emitted from the irradiation unit (2) using the second reflector (5), and performing compensation or calibration using the known substance of the gas analyzer (100); and a switching unit (8) arranged on the outside of the flue wall (1a), and adapted for removing the second reflector (5) from the optical path when analyzing component concentration, and arranging the second reflector (5) on the optical path when performing compensation or calibration.</p> |
申请人 |
HORIBA, LTD.;IDO, TAKUYA;OHNISHI, TOSHIKAZU;MORI, TETSUYA |
发明人 |
IDO, TAKUYA;OHNISHI, TOSHIKAZU;MORI, TETSUYA |