发明名称 DIFFERENTIAL THERMAL ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To reduce variations in temperature of a sample mounting position of a sample stand 4 on which a sample S to be measured and a reference sample R are mounted when differential thermal analysis is performed in which the temperature difference between the sample S to be measured and the reference sample R is used as a direct object to be measured. <P>SOLUTION: In order to measure average temperature among a plurality of positions in a sample mounting position of a sample stand 4 on which a sample S to be measured and a reference sample R are mounted, circular openings 5a, 6a are provided in the center parts of a chromel plate 5 and a chromel plate 6 which are made of a circular metal plate for rear face-side thermocouple joined to the rear face of the sample mounting position. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013036757(A) 申请公布日期 2013.02.21
申请号 JP20110170499 申请日期 2011.08.03
申请人 SHIMADZU CORP 发明人 KOZAKURA MASARU;YUASA YOSHIHITO;NAKAJIMA HIROMICHI
分类号 G01N25/20 主分类号 G01N25/20
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