发明名称 Semiconductor Contact Barrier
摘要 System and method for reducing contact resistance and improving barrier properties is provided. An embodiment comprises a dielectric layer and contacts extending through the dielectric layer to connect to conductive regions. A contact barrier layer is formed between the conductive regions and the contacts by electroless plating the conductive regions after openings have been formed through the dielectric layer for the contact. The contact barrier layer is then treated to fill the grain boundary of the contact barrier layer, thereby improving the contact resistance. In another embodiment, the contact barrier layer is formed on the conductive regions by electroless plating prior to the formation of the dielectric layer.
申请公布号 US2013043546(A1) 申请公布日期 2013.02.21
申请号 US201213657351 申请日期 2012.10.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, L 发明人 LIU CHUNG-SHI;YU CHEN-HUA
分类号 H01L29/78;H01L21/44 主分类号 H01L29/78
代理机构 代理人
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