发明名称 SURFACE TREATMENT METHOD OF SILICON EPITAXIAL WAFER
摘要 PURPOSE: A method for processing the surface of an epitaxial wafer is provided to obtain an oxide layer with uniform and stable thickness by forming an oxide layer on an epitaxial surface using ozone. CONSTITUTION: An epitaxial wafer is prepared(S100). The epitaxial wafer is inputted to a chamber(S200). An ozone generator generates ozone(S300). An oxide layer is formed on the surface of the epitaxial wafer by spraying ozone to the chamber(S400). [Reference numerals] (S100) Step of preparing an epitaxial wafer; (S200) Step of inputting an epitaxial wafer to a chamber; (S300) Step of generating ozone; (S400) Step of forming an oxide layer on the surface of an epitaxial wafer
申请公布号 KR101235419(B1) 申请公布日期 2013.02.20
申请号 KR20110049942 申请日期 2011.05.26
申请人 发明人
分类号 H01L21/20;H01L21/316;H01L21/66 主分类号 H01L21/20
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