发明名称 ROBUST HIGH ASPECT RATIO SEMICONDUCTOR DEVICE
摘要 <p>The invention relates to an semi-conductor device comprising a first surface and neighboring first and second electric elements arranged on the first surface, in which each of the first and second elements extends from the first surface in a first direction, the first element having a cross section substantially perpendicular to the first direction and a sidewall surface extending at least partially in the first direction, wherein the sidewall surface comprises a first section and a second section adjoining the first section along a line extending substantially parallel to the first direction, wherein the first and second sections are placed at an angle with respect to each other for providing an inner corner wherein the sidewall surface at the inner corner is, at least partially, arranged at a constant distance R from a facing part of the second element for providing a mechanical reinforcement structure at the inner corner.</p>
申请公布号 EP2334589(B1) 申请公布日期 2013.02.20
申请号 EP20090787279 申请日期 2009.09.24
申请人 NXP B.V. 发明人 ROOZEBOOM, FREDDY;GOOSSENS, MARTIJN;BESLING, WILLEM FREDERIK ADRIANUS;VERHAEGH, NYNKE
分类号 B81B1/00;B81B3/00;H01L29/41;H01L31/0224 主分类号 B81B1/00
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