| 摘要 |
A microscope system, and method of microscopy, comprising means operable to generate a magneto-optical Kerr effect (MOKE) on a surface and for detecting longitudinal and polar MOKE from the surface. The microscope may be used for obtaining single-shot measurements of magnetic field-driven magnetisation switching and spin-polarised current-driven magnetic domain motion in nanostructures. This may be achieved using a submicron probe in the form of a laser beam 14, focused to a submicron diameter spot on a sample 28, and also a polarised beam splitter 22, that selectively reflects light of a particular polarisation and passes it to an optical bridge detector 32 (see Fig 5). An iris 34 can be used to cover half the reflected beam for longitudinal MOKE or left open for polar MOKE measurements. The system may also include a spin-polarised current source (see Fig 9) used in detecting the direction of spin-polarised current-induced domain wall displacement. |
