发明名称 |
Trench structures in direct contact |
摘要 |
A semiconductor structure includes a semiconductor substrate of a first conductivity, an epitaxial layer of a second conductivity on the substrate and a buried layer of the second conductivity interposed between the substrate and the epitaxial layer. A first trench structure extends through the epitaxial layer and the buried layer to the substrate and includes sidewall insulation and conductive material in electrical contact with the substrate at a bottom of the first trench structure. A second trench structure extends through the epitaxial layer to the buried layer and includes sidewall insulation and conductive material in electrical contact with the buried layer at a bottom of the second trench structure. A region of insulating material laterally extends from the conductive material of the first trench structure to the conductive material of the second trench structure and longitudinally extends to a substantial depth of the second trench structure.
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申请公布号 |
US8378445(B2) |
申请公布日期 |
2013.02.19 |
申请号 |
US20100872201 |
申请日期 |
2010.08.31 |
申请人 |
INFINEON TECHNOLOGIES AG;ELATTARI BRAHIM;HIRLER FRANZ |
发明人 |
ELATTARI BRAHIM;HIRLER FRANZ |
分类号 |
H01L21/4763;H01L21/762;H01L29/06 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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