发明名称 Trench structures in direct contact
摘要 A semiconductor structure includes a semiconductor substrate of a first conductivity, an epitaxial layer of a second conductivity on the substrate and a buried layer of the second conductivity interposed between the substrate and the epitaxial layer. A first trench structure extends through the epitaxial layer and the buried layer to the substrate and includes sidewall insulation and conductive material in electrical contact with the substrate at a bottom of the first trench structure. A second trench structure extends through the epitaxial layer to the buried layer and includes sidewall insulation and conductive material in electrical contact with the buried layer at a bottom of the second trench structure. A region of insulating material laterally extends from the conductive material of the first trench structure to the conductive material of the second trench structure and longitudinally extends to a substantial depth of the second trench structure.
申请公布号 US8378445(B2) 申请公布日期 2013.02.19
申请号 US20100872201 申请日期 2010.08.31
申请人 INFINEON TECHNOLOGIES AG;ELATTARI BRAHIM;HIRLER FRANZ 发明人 ELATTARI BRAHIM;HIRLER FRANZ
分类号 H01L21/4763;H01L21/762;H01L29/06 主分类号 H01L21/4763
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