发明名称 3T DRAM cell with added capacitance on storage node
摘要 A 3T DRAM cell includes a first transistor having a first control element connected as a storage node and a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line. The 3T DRAM cell also includes a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line. Additionally, the DRAM cell includes a supplemental capacitance connected to the storage node and configured to extend a refresh interval of the 3T DRAM cell. A method of operating an integrated circuit having a 3T DRAM cell includes providing a memory state on a storage node of the 3T DRAM cell and extending a refresh interval of the memory state with a supplemental capacitance added to the storage node.
申请公布号 US8379433(B2) 申请公布日期 2013.02.19
申请号 US20100882355 申请日期 2010.09.15
申请人 TEXAS INSTRUMENTS INCORPORATED;HOUSTON THEODORE W.;KULKARNI MAKARAND R.;LAN JAMES (HSU-HSUAN) 发明人 HOUSTON THEODORE W.;KULKARNI MAKARAND R.;LAN JAMES (HSU-HSUAN)
分类号 G11C11/24 主分类号 G11C11/24
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