发明名称 Method for fabricating SOI high voltage power chip with trenches
摘要 A method of manufacturing a SOI high voltage power chip with trenches is disclosed. The method comprises: forming a cave and trenches at a SOI substrate; filling oxide in the cave; oxidizing the trenches, forming oxide isolation regions for separating low voltage devices at the same time; filling oxide in the oxidized trenches; and then forming drain regions, source regions and gate regions for a high voltage power device and low voltage devices. The process involves depositing an oxide layer overlapping the cave of the SOI substrate. A SOI high voltage power chip thus made will withstand at least above 700V voltage.
申请公布号 US8377755(B2) 申请公布日期 2013.02.19
申请号 US201013133886 申请日期 2010.09.07
申请人 SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATIONTECHNOLOGY, CHINESE ACADEMY OF SCIENCES;CHENG XINHONG;WANG ZHONGJIAN;YU YUEHUI;HE DAWEI;XU DAWEI;XIA CHAO 发明人 CHENG XINHONG;WANG ZHONGJIAN;YU YUEHUI;HE DAWEI;XU DAWEI;XIA CHAO
分类号 H01L21/332 主分类号 H01L21/332
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