发明名称 Nonvolatile memory devices having dummy cell and bias methods thereof
摘要 Provided are nonvolatile memory devices and methods of operating thereof. The nonvolatile memory devices include: dummy cells connected to a dummy bit line; and a dummy bit line bias circuit providing a dummy bit line voltage to the dummy bit line during a program operation, wherein, due to the dummy bit line voltage, at least one of the dummy cells is programmed with a threshold voltage lower than the top programmed state and higher than an erased state during the program operation.
申请公布号 US8379456(B2) 申请公布日期 2013.02.19
申请号 US20100901605 申请日期 2010.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD.;PARK CHAN;KANG CHANGSEOK;CHANG SUNG-IL;PARK YOUNGWOO;SEL JONGSUN;PARK JINTAEK 发明人 PARK CHAN;KANG CHANGSEOK;CHANG SUNG-IL;PARK YOUNGWOO;SEL JONGSUN;PARK JINTAEK
分类号 G11C11/34 主分类号 G11C11/34
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