发明名称 Integrated circuit and a method for secure testing
摘要 An integrated circuit that includes a controller and multiple internal circuitries, whereas the integrated circuit is characterized by further including a security mode determination unit that includes multiple one time programmable components for defining a security mode out of multiple possible security modes, whereas a selected circuitry mode affects access to an internal circuitry. A method for testing an integrated circuit, the method includes: receiving a request to access an internal circuitry; and responding to the request in view of a defined security mode; whereas the method is characterized by a stage of defining a security mode of a debug circuit out of multiple security modes, whereas the definition is responsive to at least a state of multiple one time programmable components.
申请公布号 US8379861(B2) 申请公布日期 2013.02.19
申请号 US20040719883 申请日期 2004.11.22
申请人 FREESCALE SEMICONDUCTOR, INC.;AKSELROD DIMITRI;AMON YOSSI;ASHKENAZI ASAF 发明人 AKSELROD DIMITRI;AMON YOSSI;ASHKENAZI ASAF
分类号 H04L9/00;G06F21/00;H04K1/00 主分类号 H04L9/00
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