发明名称 Self-test method for interface circuit
摘要 An integrated circuit is described. The integrated circuit includes an interface circuit that includes a transmitter and a receiver. A generator in the integrated circuit is selectively coupled to the transmitter. The generator is to provide a test sequence that is output by the transmitter during a test mode of operation. A memory in the integrated circuit is selectively coupled to the generator and the receiver. The memory is to receive and synchronize the test sequence and a signal corresponding to the test sequence that is received by the receiver. A logic circuit in the integrated circuit is to compare the test sequence and the signal.
申请公布号 US8378699(B2) 申请公布日期 2013.02.19
申请号 US20090430832 申请日期 2009.04.27
申请人 RAMBUS INC.;STOTT BRET;YEUNG PHILIP;BROOKS JOHN W.;LAU BENEDICT;TRAN CHANH V.;HO EUGENE C. 发明人 STOTT BRET;YEUNG PHILIP;BROOKS JOHN W.;LAU BENEDICT;TRAN CHANH V.;HO EUGENE C.
分类号 G01R31/20;G01R31/26 主分类号 G01R31/20
代理机构 代理人
主权项
地址