发明名称 Polishing pad with controlled void formation
摘要 A chemical-mechanical planarization polishing pad is provided comprising a network of elements dispersed within a polymer, a plurality of voids formed in the pad and at least a portion of said network of elements is connected to at least a portion of the voids. A method of forming the pad is also disclosed, which comprises providing a composition, the composition comprising a network of elements and at least one of a polymer or a reactive prepolymer, introducing a gas to the composition and using the gas to produce a plurality of voids in the composition. A method of forming voids is also disclosed, which relies upon the application of a force to the network of elements within the polymer or reactive polymer, followed by removal of the force and void formation.
申请公布号 US8377351(B2) 申请公布日期 2013.02.19
申请号 US20080244513 申请日期 2008.10.02
申请人 INNOPAD, INC.;LEFEVRE PAUL;WELLS DAVID ADAM;JIN MARC C.;HSU OSCAR K.;ALDEBORGH JOHN ERIK;QIAO SCOTT XIN;MATHEW ANOOP;WU GUANGWEI 发明人 LEFEVRE PAUL;WELLS DAVID ADAM;JIN MARC C.;HSU OSCAR K.;ALDEBORGH JOHN ERIK;QIAO SCOTT XIN;MATHEW ANOOP;WU GUANGWEI
分类号 B29C44/34 主分类号 B29C44/34
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