发明名称 Semiconductor device, semiconductor wafer and manufacturing method of the same
摘要 In a state where an adhesive tape is attached onto a main surface of a semiconductor wafer, a trench is formed in a rear surface of the semiconductor wafer. For forming the trench in the rear surface of the semiconductor wafer, after coating a resist film on the rear surface of the semiconductor wafer, the resist film is patterned by using the photolithography technology. The patterning of the resist film is performed so as not to leave the resist film in the region where the trench is to be formed. Then, the trench is formed in a predetermined region of the semiconductor wafer by the dry etching technology using the patterned resist film as a mask. Specifically, the trench is formed in the region near the dicing line.
申请公布号 US8378459(B2) 申请公布日期 2013.02.19
申请号 US20100795950 申请日期 2010.06.08
申请人 RENESAS ELECTRONICS CORPORATION;NAKA YASUHIRO;TANAKA NAOTAKA;UEMATSU TOSHIHIDE;MIYAZAKI CHUICHI;SUZUKI KAZUNARI;NAKAJIMA YASUYUKI;ABE YOSHIYUKI;KOHZU KENJI;KITAICHI KOSUKE;OGANE SHINYA 发明人 NAKA YASUHIRO;TANAKA NAOTAKA;UEMATSU TOSHIHIDE;MIYAZAKI CHUICHI;SUZUKI KAZUNARI;NAKAJIMA YASUYUKI;ABE YOSHIYUKI;KOHZU KENJI;KITAICHI KOSUKE;OGANE SHINYA
分类号 H01L23/544 主分类号 H01L23/544
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