发明名称 Phase change memory random access device using single-element phase change material
摘要 A phase change memory cell with a single element phase change thin film layer; and a first electrode and a second electrode coupled to the single element phase change thin film layer. A current flows from the first electrode to the single element phase change thin film layer, and through to the second electrode. The single element phase change thin film layer includes a single element phase change material. The single element phase change thin film layer can be less than 5 nanometers thick. The temperature of crystallization of the single element phase change material can be controlled by its thickness. In one embodiment, the single element phase change thin film layer is configured to be amorphous at room temperature (25 degrees Celsius). In one embodiment, the single element phase change thin film layer is comprised of Antimony (Sb).
申请公布号 US8378328(B2) 申请公布日期 2013.02.19
申请号 US20080036215 申请日期 2008.02.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;BREITWISCH MATTHEW J.;CHEN CHIEH-FANG;CHEN YI-CHOU;LAM CHUNG H.;RAOUX SIMONE 发明人 BREITWISCH MATTHEW J.;CHEN CHIEH-FANG;CHEN YI-CHOU;LAM CHUNG H.;RAOUX SIMONE
分类号 H01L29/02;H01L47/00 主分类号 H01L29/02
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